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Physical foundations and results of the study of absorption in thin films of germanium doped with silicon

Abstract

Physical foundations and results of the study of absorption in thin films of germanium doped with silicon

Novikova Yu.A., Tereshchenko G.V.

Incoming article date: 23.04.2022

Theoretical relations are presented that serve to estimate the absorbing properties of thin optical films using functions that determine the envelopes of interference extrema in the transmission spectrum of a thin optical film on a plane-parallel transparent substrate, as well as the experimental results of estimating infrared losses in Ge films doped with Si.

Keywords: interference, absorption, optics, film, refractive index