Detection of local defect areas during non-destructive testing of extended products
Abstract
Detection of local defect areas during non-destructive testing of extended products
Incoming article date: 01.12.2023The article discusses a method for detecting local areas with hidden defects in products whose length is several orders of magnitude greater than other dimensions, when processing information from non-destructive testing of the product. To obtain the necessary information, various means of introscopy and radiation of different nature are used. Processing of information obtained using scanning control should detect areas with defects and determine their nature. To compare different processing methods and select the optimal method for processing information, a computer modeling method was used, with the help of which the process of obtaining information and processing it was simulated, which simplifies the selection of the most suitable method for detecting a defect. The article describes typical models of the received signal and presents the simulation results.
Keywords: defects, non-destructive testing, extended products, simulation model, moving averaging, time series